摘要
通过WINXCOM理论计算X射线能量在20~100 keV下,钨和铅硅酸盐玻璃的质量衰减系数、有效原子序数和半值层。结果发现,随着WO_3和PbO含量的增加质量衰减系数增加。钨玻璃在70 keV能量下,由于光电效应发生突变,质量衰减系数突然增强。随后,利用MCNP 5计算5种能量下钨玻璃的积累因子,以便进一步修正模拟结果以达到真实情况。
The mass attenuation coefficients,effective atomic number and half-value layer of tungsten and lead silicate glasses have been theoretically calculated for X-rays photon energies of 20 keV^100 keV by WINXCOM program.These results indicate that the total mass attenuation coefficients were increased by increasing WO_3 and PbO concentration.Mass attenuation coefficient of tungsten glass suddenly increases at energy of 70 keV,due to the photoelectric had mutation.Subsequently,the build-up factor of tungsten glass has been calculationed by MCNP 5 at five kinds of energies,so that further amendments to the simulation results in order to achieve real situation.
出处
《核科学与工程》
CSCD
北大核心
2016年第3期424-429,共6页
Nuclear Science and Engineering
基金
成都理工大学科研启动项目(KR1115)
核废物与环境安全国防重点学科实验室开放基金项目(10zxnk01)
放射性地质与勘探技术国防重点学科实验室开放基金项目(2011RGET022)
贵州省教育厅科技项目(2011010)
四川省教育厅重点项目(13ZA0067)
国家自然科学基金项目(41273031)
关键词
硅酸盐玻璃
屏蔽材料
衰减系数
silicate glass
shielding materials
attenuation coefficients