摘要
随着国内芯片产业的不断发展,芯片供货需求大,但是批量测试无法满足供货要求,为此,该文提出一种基于NIOS II嵌入式系统的芯片自动测试系统设计。NIOS II是Altera公司推出的一种高效、灵活的可编程片上系统,由内置NIOS II软核处理器[1]、存储器、通信接口以及自定义外设构成,编写下位机自动测试控制程序并下载进FPGA,使用串口进行上下位机通信,从而完成芯片自动测试系统设计。
With the constant development of integrated circuit industry in domestic,the problem of chip batch testing becomes prominent,which can not meet the demand of mass production.Therefore,this paper proposes a chip automatic testing system based on NtOS II embedded system,which is an efficient and flexible programmable system on chip introduced by AItera company.The system include an internal NtOS II soft p- rocessor,memory,communication interface and the customization of peripherals,through writing the low machine control program and download into FPGA,and communicating with PC through Serial port,it can realize the automatic testing system.
出处
《电子质量》
2016年第12期84-87,共4页
Electronics Quality