ZrW_2O_8薄膜的合成及结构表征

Synthesis and property study on negative thermal expansion ZrW_2O_8 thin film

以溶胶凝胶法制备负热膨胀性ZrW_2O_8薄膜。以X射线粉末衍射,扫描电子显微镜、X射线光电子能谱对产物结构及形貌进行表征,结果表明所得薄膜为单一立方结构ZrW_2O_8相。所得ZrW_2O_8薄膜无明显裂纹,但存在孔洞。从整体上看,薄膜由棒状颗粒组成,其间分布由小颗粒构成的、连接成片的薄膜。薄膜厚度约为500nm。ZrW_2O_8薄膜在可见光区域是完全透光的,在紫外光区域有两个吸收峰,分别位为348.3和277.2nm。

ZrW2O8 thin film was synthesized using sol-gel method.The structure and morphology of the resul-ting film were characterized by Powder X-ray diffraction （XRD）,Scanning electron microscopy （SEM）and X-ray photoelectron spectroscopy （XPS）respectively.The results show that the films are single phase ofα-ZrW2O8 .The surface of ZrW2O8 thin film has small holes without obvious cracks.On the whole,the film is com-posed of rod-like particles,during which film is composed of small particles.The thickness of the film is about 500 nm.ZrW2O8 thin film is transparent in the visible region with two absorb peaks in the ultraviolet region, which are 348.3 and 277.2 nm respectively.