基于均匀设计的MEMS陀螺温度标定试验设计

The temperature calibration of MEMS gyro experiment design based on uniform design

针对传统的温度试验方案存在试验量大、耗费时间长的问题,提出基于均匀设计法的三轴微电子机械系统(micro-electromechanical systems,MEMS)陀螺温度标定误差补偿试验方案。设计基于均匀设计的四因素(测试温度点、温变速率、MEMS陀螺转速及转动方向)试验方案。首先,构造试验所需的均匀设计表;其次,根据LP-偏差确定MEMS陀螺温度标定误差补偿实验的最佳试验方案;最后,搭建出MEMS陀螺温度标定的实验装置进行测试。试验结果表明:与将每一个因素的不同水平组合的全面设计方案相比,该试验方案不仅节省12.5%的试验时间,还进一步减少MEMS陀螺温度标定误差试验量,缩短研究周期,节约试验成本。

In order to improve time--consuming traditional temperature test programs requiring substantial amount of testing, a temperature calibration error compensation method of three-axis MEMS gyro based on uniform design method was proposed. One temperature calibration compensation testing program based on four factors was designed. The four factors include testing temperature point, temperature changing rate, the uniform design table was established. MEMS gyro speed and direction of rotation. Firstly, Secondly, the best test method of MEMS gyro temperature calibration error compensation was determined according to LP-deviation test program. Finally, the MEMS gyro temperature calibration experimental device was built. The test results show that the designed method which compared different levels of each factor saved 12.5% testing timecompared with the traditional design. This test program contributes to reduce the amount of experiments, shorten the research cycle and save experimental cost.