原子力显微镜(AFM)应用于纳米科学中的研究进展

A Review of Atomic force Microscopy Applied in Nanoscience

原子力显微镜由于其操作简便,对样品要求不高,可检测绝缘样品,具有原子级的分辨率等优点,在纳米科学中的应用前景越来越广阔。本文简要介绍原子力显微镜的工作基本原理,并结合国内外最近的研究动态,重点阐述了纳米材料的外貌特征观察、力学分析、纳米材料加工等三个方面的研究进展。

Atomic force microscopy （AFM） has been more and more widely used in nanoscience owing to its simple operation, not strict requirements of the samples, the ability to detect insulating samples, anti atomic resolution. This paper briefly introduced the uhimate principle of AFM, and put emphasis on the research progress of three aspects including the observation of the appearance features of nano - materials, the mechanical analysis, and the nano - materials processing.