一种光信号处理芯片测试技术研究

Research of a Test Technology for Optical Signal Processing Chip

介绍了一种光信号处理芯片的测试技术,该芯片通常用于红外接收系统中,对接收到的光信号进行处理后发送到系统的数字芯片中。测试时需要输入ASK调制信号,文中通过单片机产生测试信号以取代信号发生器,有效节约了成本。该芯片内部有放大器、带通滤波器、比较器等部分,重点介绍了功能部分和带通滤波器参数的测试,包括产生测试信号的方法,如何对单片机产生的信号进行处理,以及带通滤波器中心频率的测试和修调方法。

The paper introduces a test technology for optical signal processing chip commonly applied in infrared receiving system. During the test, ASK modulation signal must be entered. In the paper, SCM is used instead of signal generator to produce test signal, which effectively reduces the cost. The SCM contains an amplifier, a band-pass filter, and a comparator. This paper describes the function and the band-pass filter parameters test including test signal generating method, SCM signal processing, and the method of testing and trimming the center frequency of bandpass filter.