星载65nm抗辐射GNSS接收机ASIC的SEFI实验方法

The SEFI test method of 65 nm radiation-hardened on-board GNSS receiver ASIC

在抗辐射GNSS接收机的研发过程中,由于Xilinx 600万门FPGA在轨单粒子翻转(Single Event Upset,SEU)效应严重,而自主研发抗辐射GNSS接收机ASIC是最有效的解决办法。以航天五院重点型号项目"XX-2"项目为依托,在国内首次采用65 nm抗辐射工艺,用单个ASIC芯片实现了1 200万门规模的星载抗辐射GNSS接收机ASIC。但是,对此款新工艺/大规模/功能复杂的ASIC芯片进行单粒子功能中断测定是一个难题。通过在FPGA上模拟GNSS数字中频信号和DSP配置输入,然后由芯片的EMIF接口实时读取芯片内部关键数据来进行SEU/SEFI的判断,并设计了SEFI判断准则和相应的辐照实验实现方案。

Since the serious single event upset（SEU） effect of Xilinx 6 million gates FPGA in orbit, a self-reliance radiation-hard- ened GNSS receiver ASIC is the most efficient way when developing the radiation-hardened GNSS receiver. Based on the key pro- ject ＂XX-2＂ of the CAST, the on-board radiation-hardened GNSS receiver ASIC of 12 million gates is implemented with the 65 nm radiation-hardened cells on the single chip, which is the first domestic 65 nm radiation-hardened ASIC. However, the single event function interruption（SEFI） measurement is a problem for this new, large scale, function complex ASIC. By simulating the GNSS digital IF signal input and the DSP configuration data, some important data that decides SEU/SEFI is read out through the EMIF interface. This paper also designs SEFI decision principles and the corresponding radiation test scheme.