傅立叶1/4波片法检测液晶光学相控阵移相量的精度分析

Precision analysis on the phase delay measurement method of Fourier quarter-wave-plate on liquid crystal optical phased array

为了能够更好地实现对液晶光学相控阵的移相分布特性进行高精度的测量,本文针对傅里叶四分之一波片法的测试精度进行理论仿真和试验验证。仿真结果表明,该方法测试误差小于0.08°,采用标准二分之一波片对其进行验证,实验结果表明重复精度小于0.3°。因此,针对液晶光学相控阵波控数据0.5°移相控制精度要求,傅里叶四分之一波片法的测试精度和重复精度能够满足移相测量精度要求。

With the purpose of highly precise measuring the phase delay distribution of liquid crystal optical phased array,the accuracy and precision of the measuring method of Fourier Quarter-Plate are both analyzed theoretically and evaluated experimentally.Numerical simulations indicate that the error of this method is smaller than 0.3° when we assumed a couple of ordinary parameters on the system.A practical experiment on a standard half wave plate is also accomplished showing that the accuracy is smaller than 0.3° and the repeat precision is also smaller than 0.3°.Simulations and experiments show a good agreement with each other so that a demonstration Fourier Quarter-Plate method can meet the requirement on phase delay measurement better than 0.5° on liquid crystal optical phased array.