摘要
为适应新型合金材料（V—Ta合金）研制的需要，建立了甩能量色散x射线荧光光谱（EDXRF）法测定V—Ta合金中Ta含量的分析方法。该方法将溶鳃的V—Ta合金切屑样制成滤纸片试样，用能量色散x射线荧光光谱仪测定其Ta含量。该方法简便、快速，测定Ta含量在25％。加％范围内的样品时，其测量结果的相对标准偏差（n=6）不大于1％。
A simple, fast, and accurate analytical method of determining Ta content in V -Ta alloy was established by adopting Energy - dispersive X - ray fluorescence spectrometric （EDXRF）. In the measurements, swarf from V - Ta alloy was dissolved and then absorbed by filter papers. Subsequently, the obtained filter paper samples were measured by EDXRF to determine Ta content. The relative standard deviation （ n = 6） of this analytical method is less than 1% , when the Ta content of test samples ranges from 25% to 40%.
出处
《核电子学与探测技术》
CAS
北大核心
2016年第7期710-713,共4页
Nuclear Electronics & Detection Technology
关键词
V—Ta合金
EDXRF法
Ta含量
V - Ta alloy
energy - dispersive X - ray fluorescence spectrometric
tantalum content
