基于相同数据位的SoC测试数据压缩方法

A STUDY ON THE TEST DATA COMPRESSION METHODS OF SYSTEM-ON-CHIP(SOC) BASED ON THE SAME TEST DATA BITS

随着VLSI技术的不断发展,集成电路所需的测试数据量也在不断增加,给测试带来了一系列问题,对自动测试设备(ATE)的存储容量提出了挑战,有限的带宽延长了测试数据传输时间。为此,提出了一种针对相同数据位的测试数据压缩及解压算法。数据位为全0或全1的数据块,编码压缩为仅为两位的控制位和编码位,与同类经典方案相比,实验表明该方案有效提高了测试数据压缩率,平均压缩率达到63.58%,且编码算法简单。

With the continuous development of very large scale integration（VLSI）, the amount of test data required by integrated circuits is increasing, which causes a series of problems to test, and brings great challenges to the storage capacity of automatic test equipment（ATE）. The limited bandwidth of ATE lengthens the transmission time of test data. Therefore, a new algorithm of test data compression/decompression is proposed based on the same bits of test data. For the data block whose data bits are all 1 or 0, the code is compressed into only two-bit control bit and two-bit encoding bit. Compared with the other classical ways, the experimental results shows that this way effectively improved the compression ratio whose average ratio increases by 63.58%, and the encoding algorithm is simpler.