错位双层膜结构全光谱减反射特性研究

The Study of Full Spectrum Anti-Reflectance Properties of Misaligned Stacked Double-Layer Structure

随着光伏-热电耦合系统的提出,具有宽光谱减反射特性的表面微结构成为太阳能高效利用的关键。本文基于传统TiO_2/SiO_2减反射膜,结合硅纳米柱,提出一种错位膜层复合结构,并从电磁场理论出发,运用时域有限差分方法研究其光谱反射特性,并分析了结构参数对光谱特性的影响。研究结果表明,通过调节复合结构特征参数,可以得到具有宽光谱特性减反射结构,结构平均反射率约为0.032。

Full spectrum anti-reflectance surface micro-structure has become increasingly significant in efficient utihzation of solar energy since the photovoltaics-thermoelectric hybrid system was proposed.In this paper,a composited structure that combines conventional TiO_2/SiO_2 antireflection coatings and sihcon nanorod is proposed and investigated through the finite difference time domain（FDTD） method.By means of calculating and analyzing the reflectance of structures with various parameters,an optimized structure which possesses full spectrum anti-reflectance properties is obtained,achieving a low reflectance of 0.032.