摘要
本文通过一系列的实验对宽带放大器的温度可靠性进行了测试和分析.旨在通过环境温度测试及温度突变测试来研究温度对功率放大器直流特性、S参数、RF输出特性和可靠性的影响.实验结果表明,环境温度的升高和突变会引起功率放大器性能发生显著退化.这对射频设备的可靠性研究和设计提供重要的指导.
In this paper, a series of experiments have been carried out to do some tests and analysis on the temperature reliability of the broadband amplifier. By the environmental temperature testing and temperature mutation testing to study the influence of temperature on the dc characteristics, S amplifier. The experimental results show that the rise parameter, RF output characteristic and reliability for the power and mutations of environmental temperature will cause significant performance degradation of power amplifier. It can provide some important guidance for the reliability research and design for the radio frequency equipment.
作者
林倩
陈超
LIN Qian CHEN Chao(College of Physics and Eleetronie Information Engineering, Qinghai University for Nationalities, Xining 810007, China School of Electronic Information Engineering, Tianjin University, Tianjin 300072, China)
出处
《天津理工大学学报》
2017年第1期35-38,共4页
Journal of Tianjin University of Technology
基金
青海省国际合作项目(2014-HZ-821)
