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BGA焊接失效的可制造性因素分析

Analysis on the manufacturing factors of BGA welding failure
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摘要 本文以企业实际生产中出现的一个非典型性BGA焊接失效案例为素材,详细介绍了不良原因分析的过程与方法,在可制造性设计方面提出具体建议,为产品设计和工艺技术人员提供经验借鉴。 the failure case for the material in the welding enterprises in the actual production of an atypical BGA, introduces the process and method of failure analysis, in the aspects of design and manufacture of specific recommendations, provide experience for product design and technical personnel.
作者 郑晓亮
机构地区 厦门技师学院
出处 《电子测试》 2017年第1期89-90,共2页 Electronic Test
关键词 BGA焊接失效 非典型性原因 可制造性设计 BGA welding failure atypical cause manufacturability design
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  • 1[1]Tong Y T,Luan J E,Eric P,et al.Novel numerical and experimental snalysis of dynamic responses under board level drop test[A].5th.Int.Conf.on Thermal and Mechanical Simulation and Experiments in Micro-electronics and Micro-Systems[C],Belgium:EuroSimE,2004.133-140.
  • 2[2]JEDEC Standard JESD22-B111.Board level drop test method of components for handheld electronic products[S].JEDEC Solid State Technology Association.2003.
  • 3[3]Mishiro K,Ishikawa S,Abe M,et al.Effect of the Drop Impact on BGA/CSP Package Reliability[J].Microelectronics Reliability,2002,42:78-82.
  • 4[4]Wu J D,Ho S H.Board level reliability of a stacked CSP subjected to cycling bending[J].Microelectronics Reliability,2002,42:407-416.
  • 5[5]Seah S K,Lim C T,Wong E H,et al.Mechanical response of PCBs in portable electronic products during drop impact[A].Electronics Packaging Technology Conference[C].Singapore:2002:120-125.
  • 6[6]Prince A L.A comprehensive compendium of evaluated constitutional data and phase diagram[M].NewYork:VCH publisher,1988,5:66.
  • 7[7]Ka Y L,Li M,Olsen D R,et al.Microstructure,joint strength and failure mechanism of Sn-Ag,Sn-Ag-Cu versus Sn-Pb-Ag solder in BGA package[J].IEEE Transactions on Electronic Packaging,2002,25(3):185-192.
  • 8[8]Salam B,Ekere N,Rajkumar D.Study of the interface microstructure of Sn-Ag-Cu lead-free solders and the effect of solder volume on intermetallic layer formation[A].Electronics Components and Technology Conference[C].Orlando,USA:2001.
  • 9[9]Li X Y,Wu B S,Yang X H,et al.The formation and evolution of IMC and its effect on the solder joints properties[A].International Conference on Electronic Packaging Technology[C].Shenzhen:2005.
  • 10[10]Lim C T,Teo Y M,Shim V P W,et al.Numerical simulation of the drop impact response of a portable electronic product[J].IEEE Transactions on Advanced Packaging Technology,2002,25(3):478-485.

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