一种实现ADC采样数据回路自检的方法

Method of ADC Sampling Data Circuit Self-test

ADC采样数据作为电力系统二次保护装置数据的重要来源,是保护装置动作行为的重要判断依据。然而目前市场上主流的多通道同步ADC芯片不具备采样数据校验功能,芯片焊接问题导致的采样数据异常无法及时发现,而这将可能导致保护装置误动作,造成严重的电力事故。本文提出了一种ADC采样数据回路自检的实现方法,通过外部自检回路回馈的方式巧妙的配合ADC芯片采样时序来检查ADC芯片是否存在焊接问题,从而判断ADC采样数据回路是否连接正常。该方法实时性高,可有效降低因ADC采样数据异常而导致保护装置错误的动作行为而产生的恶劣影响和经济损失。

The ADC sampling data is an important source of power system protection,which is an important basis to judge behavior of protection devices. However,the multi-channel simultaneous ADC chips do not have the data check function, so the abnormal sampling data caused by welding problems can not be able to detect, and which can result in the protection device malfunction and serious electrical accidents. Therefore, a method to achieve ADC sampling data circuit self-test is proposed,it uses the ADC sampling timing by an external feedback circuit to check whether the ADC chip welding problem exists,in order to determine the ADC sampling data circuit is connected properly. The method can effectively reduce adverse impacts and economic losses by protection device wrong behavior caused by ADC sampling data abnormal.