多片MOV并联型避雷器在10/350μs波形冲击实验过程中的性能参数变化

Multi-Chip MOV Shunt Arrester Performance Parameters in 10/350 μs Waveform Impulse Test

采用了20 kV多波形发生器、红外温枪,相关性分析等实验方法研究了多片MOV并联型避雷器在10/350μs波形冲击实验过程中的性能参数变化。实验表明:在10/350μs波形冲击破坏过程中,电荷Q和单位能量W/R存在显著的正相关性关系;10/350μs波形的冲击会导致MOV自身的阻抗发生变化,从而使多片MOV并联型避雷器中的各MOV产生温度差;用新的MOV替换损毁的MOV接入并联体可以使得避雷器重新恢复保护效能,但无法保证其使用寿命。

The multi-chip shunt arrester MOV performance parameters in 10/350μswaveformimpulse test is studied by using experimental methods 20 kV multi-waveform generator, infraredthermometers, correlation analysis. Experimental results show that： in the 10/350 txs waveform impulsedamageprocess, there is a charge Q and specific energy W/R significantly positive correlationrelationship; 10/350μs waveform impulse will cause MOV its impedance changes, so that each MOV inmulti-chip shunt arresters will produce temperature difference; replace damaged MOV with the newaccess parallel body can restore the lightning protective efficacy, but cannot guarantee its service life.