摘要
Focused ion beam techniques have been applied in Geosciences since 10-15 years. The basic principal of FIB is using accelerated Ga-ions to sputter material from a target. At the beginning of FIB application in Geosciences it was utilized as a tool to prepare site-specific samples for transmissionelectron microscopy （TEM）.
Focused ion beam techniques have been applied in Geosciences since 10-15 years. The basic principal of FIB is using accelerated Ga-ions to sputter material from a target. At the beginning of FIB application in Geosciences it was utilized as a tool to prepare site-specific samples for transmissionelectron microscopy （TEM）.
