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利用电子能量损失谱对二氧化铀电子结构的研究 被引量:2

Study of electronic structure of actinides using electron energy loss spectroscopy
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摘要 锕系元素因具有复杂的5f电子结构,其显示出神秘而又独特的物理、化学特性。为了加深对锕系金属、合金和化合物的特异行为的理解,对其电子结构精确表征的重要性日益凸显。电子显微技术与电子能量损失谱技术的结合在锕系元素原子结构和电子结构研究中发挥了至关重要的作用。本文采用电子能量损失谱研究二氧化铀的5f电子结构,并讨论了铀5f电子的相互作用特性。 The actinides exhibit intriguing and unique physicochemical properties due to the complicated electronic structure of the5 f states. To achieve a better understanding of the distinct properties of actinide metals,alloys,and compounds,an accurate characterization for electronic structure is required. The high resolution transmission electron microscopy combined with electron energy loss spectroscopy( TEM-EELS) methods which are of great importance have been employed to investigate the local atomic and electronic structure for actinides at the sub-Angstrom scale. In this work,we employ EELS to study the 5f electron structure of UO2 and the 5f electron interaction.
出处 《电子显微学报》 CAS CSCD 2017年第1期1-6,共6页 Journal of Chinese Electron Microscopy Society
基金 国家自然科学基金资助项目(No.11474249 No.11374009 No.61574123 No.51541109 No.U1630250) 国家重点基础研究计划项目(973计划)(No.2015CB654901) 重点实验室学科发展基金(No.ZDXKFZ201413)
关键词 电子能量损失谱 锕系材料 电子结构 EELS actinides electronic structure
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  • 1Kiguchi M, Goto T, Saiki K, et al. Atomic and electronic structures of MgO/Ag ( 001 ) heterointerface [ J ]. Surf Sci, 2002,512:97- 106.
  • 2Pantel R, Wehbe-Alause H, Jullian S, et al. Analytical transmission electron microscopy observation of aluminiumtungsten interaction in thermally stressed Al/Ti/W/TiN interconnections[ J]. Microelectronic Eng, 2002,64:91 - 98.
  • 3Wang Z L,Bentley J, Evans N D. Valence state mapping of cobalt and manganese using near-edge fine structures [ J ]. Micron, 2000,31 : 355 - 362.
  • 4Yu-Zhang K, Imhoff D, Leprince-Wang Y, et al. Muhi-scale analysis of the nanostructured granular solid CoO-Ag by TEM and EELS[J]. Acta Mater,2003,51:1157- 1166.
  • 5Wang Z L, Yin J S, Jiang Y D, EELS analysis of cation valence states and oxygen vacancies in magnetic oxides [J]. Micron,2000,31:571 - 580.
  • 6Spence J C H. The future of atomic resolution electron microscopy for materials science[J]. Mater Sci Eng, 1999, 26 : 1 - 49.
  • 7朱静,叶恒强,王仁卉,温树林,康振川.高空间分辨分析电子显微学[M].北京:科学出版社,1998.277-393.
  • 8Egerton R F. Electron Energy Loss Spectroscopy in the Electron Microscope[M]. New York: Plenum Press, 1996. 262 - 340.
  • 9Titchmarsh J M, Detection of electron energy-loss edge shifts and fine structure, variations at grain [ J ]. Uhramicroscopy, 1999, 78:241 - 250.
  • 10Pearson D H, Ahn C C, Fuhz B. White lines and delectron occupancies for the 3d and 4d transition metals. Phys Rev B, 1993, 47:8471 - 8478.

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