老炼方式对40.5kV真空灭弧室投切背对背电容器组的影响

Effect of Ageing Method on 40.5 kV Vacuum Interrupter for Switching Back-to-back Capacitor Bank

为了降低真空灭弧室在投切背对背电容器组时的重燃率,文中采用试验的方法,研究了电压老炼、电流老炼和纳秒脉冲老炼对40.5 kV真空灭弧室投切背对背电容器组的影响,得出了老炼方式对40.5 kV真空灭弧室投切背对背电容器组的影响。纳秒脉冲老炼可以比较均匀的覆盖整个触头表面,而电压老炼和电流老炼只能覆盖触头表面的局部。纳秒脉冲老炼的真空灭弧室一次性通过投切背对背电容器组试验,电流老炼的真空灭弧室完成16次投切背对背电容器组试验后发生重燃,电压老炼的真空灭弧室完成一次投切背对背电容器组后300 ms发生重燃。

To reduce the reignition rate of a vacuum interrupter in switching back to back capacitor bank, the effects of voltage ageing, current ageing and nanosecond pulse ageing on the 40.5 kV vacuum interrupter for switching back-to-back capacitor bank are investigated, hence effect of ageing method on 40.5 kV vacuum interrupter for switching back-to-back capacitor bank is obtained. The contact surface can be aged completely by the nanosecond pulse ageing method, while the contact surface can only be partly aged by the voltage or current ageing method. The vacuum interrupter aged by the nanosecond pulse ageing method can successfully pass the switching test of back-to-back capacitor bank. The vacuum interrupter aged by the current ageing method can pass the switching test of back-to-back capacitor bank for 16 times, then reignition occurs. The vacuum interrupter aged by the voltage ageing method can pass the same test for only once, then reignition occurs 300 ms after the switching.