摘要
We propose and demonstrate to derive the Auger recombination coefficient by fitting efficiency-current and carrier lifetime-current curves simultaneously, which can minimize the uncertainty of fitting results. The obtained Auger recombination coefficient is 1.0x10(-31) cm(6)s(-1) in the present sample, which contributes slightly to efficiency droop effect.
We propose and demonstrate to derive the Auger recombination coefficient by fitting efficiency-current and carrier lifetime-current curves simultaneously, which can minimize the uncertainty of fitting results. The obtained Auger recombination coefficient is 1.0x10(-31) cm(6)s(-1) in the present sample, which contributes slightly to efficiency droop effect.
基金
Supported by the National Key Research and Development Program of China under Grant No 2016YFB0400102
the National Basic Research Program of China under Grant Nos 2012CB3155605,2013CB632804,2014CB340002 and 2015CB351900
the National Natural Science Foundation of China under Grant Nos 61574082,61210014,61321004,61307024,and 51561165012
the High-Technology Research and Development Program of China under Grant No 2015AA017101
the Tsinghua University Initiative Scientific Research Program under Grant Nos 2013023Z09N and 2015THZ02-3
the Open Fund of the State Key Laboratory on Integrated Optoelectronics under Grant No IOSKL2015KF10
the CAEP Microsystem and THz Science and Technology Foundation under Grant No CAEPMT201505
the Science Challenge Project under Grant No JCKY2016212A503
the Guangdong Province Science and Technology Program under Grant No 2014B010121004
