用光学延迟器和旋转器测量双折射性质的方法

Mathods of Measuring Birefringence Properties Using Optical Retarder and Rotator

本文描述使用光学延迟器和旋转器系统测量双折射性质的方法。实验装置包括由波板、Kerr池、Pockels池、Faraday旋转器及偏振器等组成。采用Jones矩阵分析方法,对不同实验组态作了比较讨论,选出最佳的实验安排。

The methods of measuring direfringence properties using the optical retarder and the rotator are deserbed. The experimental device consists of the wave plate, Kerr cell, Pockels cell, Faraday rotator and the polarizers. Based on Jones metrix analytical method, a comparative discussion for different experimental configurations is made. From these analysis, a best experimental arrangement is chosen. It is possible to enhance the sensitivity and to improve the veproducibility of experimental results.