0.35μm CMOS工艺的品质因数时域测量电路

Circuit of time-domain quality factor measurement in 0.35μm CMOS process

基于品质因数的时域测量方法,提出了一种新的可以片上集成的品质因数测量电路,不仅在特定频率能实现品质因数的精确测量,还可在保持电路精度的前提下,覆盖一定待测信号的频带.在采用之前提出的可重构电路的基础上,改进了峰值探测器的补偿方式,进行了系统精度和扩频所需的理论分析,有效指导了电路的设计.另外,数字控制逻辑的改进,将总功耗降低7.5%.并通过集成电路的方式在0.35μm CMOS工艺下实现此电路,在电源电压为5V,输入信号频率为1MHz的条件下,实现品质因数的相对误差小于±0.2%,并且在精度不变的情况下,将待测信号的频段扩展到100kHz^1.5MHz.

Based on the time-domain quality factor （Q-factor） measurement principle, an architecture which not only achieves an accurate Q-factor at the specific frequency but also covers a range of frequencies without any loss in Q-factor measurement accuracy is proposed. Based on a reconfigurable structure, an improved peak detector compensation method is presented. To guide the design of such an architecture, a theoretical analysis for reaching the required accuracy and expanding the input frequency range has been first developed in this paper. Besides, the system power dissipation can be reduced by 7.5%thanks to the improved digital control logic. In this paper, circuit is realized in a 0. 35 tzm CMOS process for the first time. With the 5V supply voltage and 1 MHz input frequency, the post-layout simulation result have demonstrated that an accuracy of the Q-factor measurement is within 0. 2%. Furthermore, the input frequency range that can be measured by this circuit is extended from 100 kHz to 1.5 MHz with the same accuracy.