摘要
We present a simple method to measure the spatial coherence of hard x-ray beams. Based on the convolution of Gaussian functions, we analyze the diffraction patterns of a grating irradiated by partially coherent hard x rays with a constrained beam diameter. The spatial coherence properties of an x-ray beam are obtained from the width of the diffraction peaks with high accuracy. The results of experiments conducted by combining a pinhole with a grating show a good agreement with our calculation using the Gaussian-Schell model.
We present a simple method to measure the spatial coherence of hard x-ray beams. Based on the convolution of Gaussian functions, we analyze the diffraction patterns of a grating irradiated by partially coherent hard x rays with a constrained beam diameter. The spatial coherence properties of an x-ray beam are obtained from the width of the diffraction peaks with high accuracy. The results of experiments conducted by combining a pinhole with a grating show a good agreement with our calculation using the Gaussian-Schell model.
基金
supported by the National Natural Science Foundation of China under Grant Nos. 11505278 and 11675253
