摘要
存储器的高集成度化、高速化,为存储器测试带来了极大挑战。论文介绍了存储器测试图形的原理和发展,基于传统的存储器测试图形,综合描述了目前国内外几种较为新颖的且可用于实际工业生产的存储器测试图形改进算法。
It brings big challenge to the testing of semiconductor memory with the development of its high integration and speed.The principle and development of test pattern for memory are introduced.Ameliorated test pattern for memory used in industry manufacture based on traditional test pattern for memory is described synthetically at present.
出处
《计算机与数字工程》
2017年第4期740-744,共5页
Computer & Digital Engineering
关键词
存储器测试
测试图形
改进的齐步算法
memory test
test pattern
improved march pattern algorithm
