摘要
气密性封装产品的气密性和气密可靠性对产品的长期使用寿命和可靠性是至关重要的。主要分析了镀金引线低温玻璃密封失效的原因,并针对分析中发现的引线与玻璃之间存在微裂纹现象进行了结构优化和验证,解决了产品密封的一致性和可靠性问题,并为相同结构封装的密封可靠性水平的提高提供了一定的参考。
The hermeticity and hermetic reliability importance to their long service life and reliability of hermetic package products are The reasons of the seal failure of low temperature glass with goht plated lead are analyzed, and the structure optimization and verification are carried out for the micro crack between the lead and the glass found in the analysis process, so the consistency and reliability of the sealing of products are solved, which provides a reference for the structure. improvement of sealing reliability of packages with the samestructure.
出处
《电子产品可靠性与环境试验》
2017年第2期24-29,共6页
Electronic Product Reliability and Environmental Testing
关键词
低温玻璃熔封
镀金引线
气密性
失效分析
low temperature glass sealing
gold plated lead
hermeticity
failure analysis
