摘要
提出了一种基于向量传播的单粒子瞬态(SET)模拟方法。基于4值参数的模型来表征SET脉冲的形状,建立脉冲参数传播的数据库。使用查找表及经验公式来计算SET脉冲形状参数在逻辑门节点之间的传播。为了模拟SET脉冲在传播过程中的重汇聚,定义了4种重汇聚模式,并给出对应的等效脉冲计算方法。提出的基于向量传播的分析算法能够对SET脉冲的产生、传播及捕获过程进行精确分析。ISCAS'89电路的实验结果表明,该方法与Hspice仿真方法的平均误差为1.827%,计算速度提升了1 700倍。在不损失精度的前提下,该方法可对VLSI电路在通用或特定测试向量下的可靠性进行快速自动分析。
An emulation method of single event transient(SET)based on input vector propagation was presented.First,a four-value parameter model was proposed to characterize the shape of SET pulse and a database for pulse parameter propagation was established.Second,the propagations of SET pulse shape parameter between the nodes of logic gates were calculated by using look up tables combined with experiential equations.Third,four kinds of re-convergent mode were defined and the corresponding equivalent pulse's calculating methods were given to deal with re-convergent.The proposed analysis algorithm based on input vector propagation could be used to accurately analyze the generation,propagation and capture of SET.Experiments on ISCAS'89circuits showed that this method was 1 700 times faster than Hspice simulation with only 1.827% average accuracy deviation.On the premise of no loss of accuracy,the proposed method could analyze the reliability for VLSI circuits with general or specific test patterns rapidly and automatically.
作者
李悦
蔡刚
李天文
杨海钢
LI Yue CAI Gang LI Tianwen YANG Haigang(Institute of Electronics, Chinese Academ y of Sciences, Beij ing 100190, P. R. China University of the Chinese Academy of Sciences, Beijing 100049, P. R. China)
出处
《微电子学》
CSCD
北大核心
2017年第2期268-273,共6页
Microelectronics
基金
国家自然科学基金资助项目(61271149)
国家科技重大专项资助项目(2013ZX03006004)
关键词
可靠性
软错误率
单粒子瞬态
重汇聚
Reliability
Soft error rate
Single event transient
Re-convergent