摘要
本文分析比较了基本放大电路、T型反馈放大电路、高频补偿T型反馈放大电路和并联补偿放大电路四种微电流放大电路的响应特性。研究了转移电阻和布线引入的分布电容对放大电路增益和响应速度的影响。探讨了影响微电流放大器的稳定性、可靠性因素以及提升放大器的稳定性和可靠性的措施。对并联补偿放大电路脉冲响应的时间常数进行了测试,测试结果为80μs。理论分析和实验研究表明,并联补偿放大电路具有增益大、响应速度快等优点,稳定性好,可靠性高,在离子迁移谱中具有良好的应用前景。
The response characteristics of four kinds of micro current amplifying circuits, including the basic amplifier circuit, the T type feedback amplification circuit, the high frequency compensation T type feedback amplifier circuit and the parallel compensation amplifying circuit, are analyzed and compared. The influence of the distribution capacitance of the transfer resistance and the wiring on the gain and the response speed of the amplifiers are studied. The stability and reliability of micro current .amplifier are discussed, and the measures to improve the stability and reliability of the amplifier are discussed. The time constant of the impulse response of the parallel compensation amplifying circuit is tested, and the test result is 80μs. Theoretical analysis and experimental results show that the parallel compensation amplifier circuit with high gain, high response speed, good stability, high reliability, has a good application prospect in the field of ion mobility spectrum.
作者
张修太
姚琏
龚克
ZHANG Xiu -tai YAO Lian GONG Ke(Anyang Institute of Technology, School of Electronic Information and Electrical Engineering, Anyang Henan 455000, China Xinyang Normal University, College of Physics and Electronic Engineering, Xinyang Henan 464000, China)
出处
《核电子学与探测技术》
北大核心
2016年第12期1205-1209,共5页
Nuclear Electronics & Detection Technology
基金
基金项目:毫米波基片集成介质谐振器天线研究(61571386)
关键词
微电流放大器
响应速度
T形反馈
高频补偿
并联补偿
Weak Current Amplifier
Response Speed
T Type Feedback
High Frequency Compensation
