期刊文献+

抛光液pH值、温度和浓度对蓝宝石抛光效率的影响 被引量:7

Effect of Slurry pH, Temperature and Concentration on Removal Efficiency of Sapphire Material
下载PDF
导出
摘要 目的研究抛光液pH值、温度和浓度对化学机械抛光蓝宝石去除率的影响,以提高抛光效率。方法采用CP4单面抛光试验机对直径为50.8 mm C向蓝宝石晶元进行化学机械抛光,通过电子分析天平对蓝宝石抛光过程中的材料去除率进行了分析,采用原子力显微镜(AFM)对蓝宝石晶元抛光前后的表面形貌和粗糙度(Ra)进行了评价。结果蓝宝石在化学机械抛光过程中的材料去除率均随抛光液pH值和温度的升高呈先增大后减小趋势。当抛光原液与去离子水按1:1的体积比混合配制抛光液,KOH调节pH值为12.2,水浴加热抛光液35℃时,蓝宝石抛光的材料去除率(MRR)达到1.119μm/h,Ra为0.101 nm。结论随着pH的增大,化学作用逐渐增强,而机械作用逐渐减弱,在pH为12.2的时候能达到平衡点,此时的MRR最佳;随着温度的升高,化学作用逐渐增强,而机械作用保持不变,抛光液温度为35~40℃时,化学作用与机械作用达到平衡,MRR最佳,当温度高于40℃后,抛光液浓度明显增大,而过高的浓度会导致MRR的减小。抛光液的相关性能优化后,化学机械抛光蓝宝石的MRR较优化前提高了71.4%。 The work aims to study effects of slurry PH, temperature and concentration on removal rate of sapphire material to improve polishing efficiency. Chemical mechanical polishing (CMP) for C-plane sapphire wafer with diameter of 50.8 mm was performed by using CP-4 single-sided tester. The removal rate of material during sapphire polishing was analyzed by using electronic analytical balance. Surface topography and roughness (Ra) were both evaluated with atomic force microscopy (AFM). The effect of different SiO2 slurry (different pH, temperature and concentration) on the material removal rate (MRR) was investigated. MRR first increased and then decreased as slurry pH (10.4 to 12.2) and temperature (20 ℃ to 45 ℃) increased. The MRR and Ra were 1.119 μm/h and 0.101 nm respectively provided with KOH adjusted pH of 12.2, water-bath heating slurry temperature of 35 ℃ and volume ratio of original slurry: DI water of 1:1. Chemical effect is enhanced and mechanical effect is weakened as pH increases. Equilibrium point and optimal MRR are available when the pH value is 12.2; chemical effect is enhanced and mechanical effect remains unchanged as the temperature increases. The two effects achieve a balance and optimal MRR is available at the slurry temperature of 35~40 ℃. Concentration of the slurry increases significantly if the temperature exceeds 40 ℃. Too high concentration may lead to decrease of MRR; MRR of the sapphire subject to chemico-mechanical polishing increased by 71.4% af-ter relevant properties of the slurry have been optimized.
出处 《表面技术》 EI CAS CSCD 北大核心 2017年第5期261-265,共5页 Surface Technology
关键词 蓝宝石 抛光液 材料去除率 化学机械抛光 PH值 温度 sapphire slurry material removal rate chemical mechanical polishing pH temperature
  • 相关文献

参考文献5

二级参考文献44

  • 1王银珍,周圣明,徐军.蓝宝石衬底的化学机械抛光技术的研究[J].人工晶体学报,2004,33(3):441-447. 被引量:36
  • 2王娟,檀柏梅,赵之雯,李薇薇,周建伟.蓝宝石衬底片的抛光研究[J].电子工艺技术,2005,26(4):228-231. 被引量:13
  • 3周海,姚绍峰.蓝宝石晶片纳米级超光滑表面加工技术研究[J].金刚石与磨料磨具工程,2005,25(5):28-31. 被引量:13
  • 4马振国.蓝宝石衬底CMP动力学控制过程与技术研究[D].河工大硕士毕业论文,2007:42-47.
  • 5MENDEL E. Polishing of silicon [J]. Solid State Technology, 1967, 10 (8): 27-29.
  • 6LEEW S, KINS Y, SEOY J. An optimization of tungstem plug chemical mechanical polishing (CMP) using different consumables [J]. J Materials Science, 2001, 12 (1): 63- 68.
  • 7SHAH V. Development of a new generation polyurethane polishing pad used in chemical mechanical plananzation of microelectronie materials [D]. MS thesis, University of Massachusetts Lowell, USA, 2002:43-48.
  • 8HCMANDCZ J. Surfance chemistry studies of copper chemical mechnical planarization [J]. Journal of the Electric Mechanical Society, 2000, 147 (2): 706-712.
  • 9MOON Y. Mechanical aspects of the material removal mechanism in chemical mechanical polishing (CMP) [D]. Berkeley, CA, USA; Department of Engineering University of California at Berkeley, 1999.
  • 10KUM H. Self-conditioning of encapsulated abrasive pad in chemical mechanical polishing [J]. Journal of Materials Processing Technology, 2003, 142: 614-618.

共引文献29

同被引文献69

引证文献7

二级引证文献38

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部