摘要
当下社会经济发展十分迅速,电子防盗锁的更新换代也紧跟时代的步伐。本文主要以电子防盗锁的微控制器芯片为测试对象,对电子防盗锁的温度传感电路、开关状态监测电路以及接口电路三大功能电路性能进行测试研究。
the current social and economic development is very rapid, electronic anti-theft lock update also keep up with the pace of the times. This paper mainly to the microcontroller chip electronic anti-theft lock for the test object, test of electronic anti-theft lock temperature sensing module, switch state monitoring module and interface module three module circuit performance.
出处
《科技风》
2017年第11期9-10,共2页
关键词
电子防盗锁
微控制器
芯片
电路
electronic anti-theft lock
microcontroller
chip
circuit