电感耦合等离子体发射光谱法测定铜铬铟合金中的痕量铟

Determination of Indium in Copper-Chromium-Indium Alloy by ICP-OES

铜铬铟合金是目前研究的热门高强高导合金材料,具有优异的力学性能。本文利用电感耦合等离子体发射光谱法(ICP-OES)建立了铜铬铟合金中铟元素的测定方法,优化了仪器操作参数、考察了基体干扰情况,确定了230.606nm为分析谱线,用基体匹配法建立标准曲线。对铜铬铟合金进行了精密度和回收实验,相对标准偏差(RSD)为2.56%~3.87%,加标回收率在94%~104%之间。结果表明,该方法快速简捷,准确度高。

Copper-chromium-indium（Cu-Cr-In） alloy is a kind of high strength and high conductivity alloy material with excellent mechanical properties. The method for the determination of indium in Cu-Cr-In alloy by inductively coupled plasma optical emission spectrometry was established. The operation parameters of the instrument were optimized and the interference of matrix was investigated to determine the analytical spectral line at 230. 606 nm and establish the standard curve by matrix matching method. Finally,the precision and recovery experiments of Cu-Cr-In alloy were carried out, and the RSDs were 2.56%-3.87% and the recoveries were 94%-104%. Results showed that the method has the advantages of high accuracy, and simple and rapid operation.