超大规模集成电路可靠性设计与测试技术的新进展

New Progress of Reliability Design and Testability Technology for VLSI

随着芯片制造工艺的不断发展,超大规模集成电路集成度不断提高,体积不断缩小。纳米工艺一方面带来产品规模、产品性能的提升,另一方面带来了产品可靠性,不可信制造和测试效率、测试覆盖率等诸多问题。为应对这些问题,设计工程师和测试工程师研发了很多新的方法,分析了超大规模集成电路在可靠性设计和测试技术发展的最新进展,最后指出了VLSI可靠性设计和测试技术的发展方向。

Nano-technology can improve the performance of chip with more complicated functions.But on the other hand, it also causes many problems such as low reliability,low test efficiency and low test coverage etc.To solve the mentioned problems,the chip design and test engineer develop many new methods.This paper analyses the new development of relia- bility and test technology for chip firstly.At last,it points out the technological development direction.