摘要
微波组件产品被广泛地应用于通信和导航等领域,其可靠性的高低是影响电子装备可靠性的重要因素。高加速寿命试验能够在产品开发的早期识别出产品的设计缺陷和薄弱环节,从而改善产品的可靠性。因此,对微波组件产品的高加速寿命试验方法进行了详细的介绍,对于其高加速寿命试验的正确开展具有一定的指导意义。
Microwave modules are widely used in the fields of communication and navigation, and their reliability level is an important factor affecting the reliability of electronic equipments. HALT can identify the design defects and weak links in the early stage of product development, so as to improve its reliability. Therefore, the HALT for microwave modules is introduced in detail, in hope that some guidance can be provided for the proper development of HALT for microwave modules.
出处
《电子产品可靠性与环境试验》
2017年第3期69-73,共5页
Electronic Product Reliability and Environmental Testing
