纳米/微米颗粒表面ζ-电势测量的验证试验

Verification testing in ζ-potential measurement of Nanometer/micro-particle

采用标准物质对ζ-电势测量的可行性加以评判。结果表明,ζ-电势的两种光学测量方法——电泳光散射法和显微镜法都有较好的重复性和准确性,对于标准样品,电泳光散射法测量重复性小于3%,测量误差小于4%;显微镜法测量重复性小于4%,测量误差小于7%。研究结果对该类仪器校准的标准物质研制和校准规范的制订具有积极的参考意义。

In the progress of standard formulation of ＂ζ-potential measurement method＂ , the feasibility of ζ-potential measurement had been judged by standard reference materials . The results show the good repeatability and accuracy in the 2 kinds of optical measuring method of ζ-potential - electrophoresis light scattering and microscopy. For the standard materials, electrophoresis light scattering measurement repeatability is less than 3%, the measurement error is less than 4%. Microscopy measurement repeatability is less than 4%, the measurement error is less than 7%. The results of this study have a positive reference value for the development of the reference materials and the establishment of calibration standards.