摘要
采用表面印迹技术合成了铜离子印迹聚烯丙基胺硅胶材料(IIP-PAA/SiO_2),通过静态实验研究了吸附剂浓度W0对Cu(II)离子在IIP-PAA/SiO_2材料上吸附的影响.结果表明,随着W0增加,Cu(Ⅱ)/IIP-PAA/SiO_2体系的吸附等温线下降,吸附体系具有明显的吸附剂浓度效应.实验数据显示吸附剂的平衡吸附量Qe与液相平衡浓度Ce和吸附剂浓度W0之间具有相关性,通过C_e/W_0(液相平衡离子浓度与吸附剂浓度的比值)因子来修正经典Langmuir模型参数,所得的修正Langmuir等温式能描述和预测不同吸附剂浓度W0水平下的平衡吸附量Qe,表明该修正模型具有合理性.
Surface ion-imprinted poly（allylamine）-silica material （ⅡP-PAA/SiO2） was synthesized by surface imprinting technique. The effect of sorbent concentration （W0） on Cu（Ⅱ） adsorption was studied using batch experiments. The results showed that the adsorption system exhibited a significant sorbent concentration effect, and adsorption isotherms declined as IV0 increased. Results obtained from the tests also indicated that the equi- librium adsorption capacity Qe was not a single function of the equilibrium ion concentration Ce but a function of both C and Wo. A revised Langmuir model was obtained according to the factor of Co/Wo. Its applicability was examined, and the result showed that the equilibrium capacities under various particle concentrations could be described well by the revised Langmuir model.
出处
《郑州大学学报（工学版）》
CAS
北大核心
2017年第3期35-38,共4页
Journal of Zhengzhou University（Engineering Science）
基金
河南省重点科技攻关计划项目(152102310063)
