基于半导体制冷技术的高低温试验箱设计

Design of High-Low Temperature Test Chamber Based on Semiconductor Refrigeration Technology

设计了一种基于半导体制冷技术的高低温试验箱,以MC9S12XS128为核心控制芯片,运用半导体制冷片作为该系统的制冷装置,硅胶发热片用来作为加热装置。通过优化布置DS18B20,对试验箱进行多点精准测温,并将测得的温度信息实时传输给主控芯片进行数据处理。在计算机上位机界面可对所需的温度范围进行设定,同时显示当前箱内的温度。实验结果表明,所设计的高低温试验箱具有体积小、结构简单、控制精度高、稳定性好等优点,可满足高精密仪器灵敏度测试对环境的严格要求,能广泛应用于工程实际中。

Based on semiconductor refrigeration technology, a high- low temperature test chamber was designed, which took MCgS12XS128 as the core control chip, semiconductor refrigeration plate as the cooling device, and the silica sheet as the heating device. The accurate temperature measurement was conducted on multi - points of the test chamber through the optimized layout of DS18B20, and the measured temperature information was transmitted to the main control chip for real - time data processing. The temperature range can be set on the upper computer interface, which also shows the current temperature in the box. The experimental results show that the designed high - low temperature test chamber has the advantages of small size, simple structure, high control pre-cision, and good stability. It can meet the rigid requirements of high precision instrumentation sensitivity test for the environment, and can be applied into practical projects.