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HL-2A装置SDD软X射线PHA阵列实验结果 被引量:2

Experimental results from SDD soft X-ray PHA array on the HL-2A tokamak
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摘要 用软X射线脉冲高度分析(PHA)阵列系统获得了等离子体的电子温度剖面和电子速率分布的时间演化。测量结果表明,电子温度剖面在OH阶段较平缓,接近抛物线1.0×[1-(r/a)2]2分布;而在ECRH(功率0.8MW)阶段,等离子体中心(z=0)电子温度上升了0.6keV,边缘(z=30cm)处只上升了0.1keV,反映出ECRH功率沉积在等离子体中心区域;在ECRH期间有大量的高能电子产生,因而电子速率分布在ECRH期间显著改变;等离子体中心的高能电子的数量和能量都比等离子体边缘的增加更大,ECRH(~0.8MW)期间等离子体中心(z=0)产生的高能电子的能量可达17keV。分析表明:在ECRH(纵场Bt=1.3T)放电期间,ECRH加热效果显著,ECRH的功率主要沉积在等离子体中心附近;电子温度剖面在ECRH阶段较OH阶段峰化;ECRH期间有大量的高能电子产生,电子速率分布被改变成为非麦克斯韦分布。 The time evolution of electron temperature (Te) profile and electron velocity distribution can be obtained by means of the new soft X-ray pulse height analysis(PHA) array system. Preliminary experimental results obtained from the PHA system show that the Te profile during ohmic heating (OH) phase is correspondingly flat,and close to the analogical parabola form of 1.0×[1-(r/a)2]2; the Te profile become peaking during near-axis ECRH (0.8 MW),the Te in the plasma center (z=0) increase 0.6 keV,however,the increment of Te in the plasma edge (z=30cm) is only 0.1keV,a mass of high-energy electrons are generated during ECRH phase,therefore,the electron velocity distribution is changed evidently during ECRH; both the number and energy of the high-energy electrons is larger in plasma center (z=0) than that in plasma edge (z=30cm),the energy of high-energy electrons in plasma center can extend to 17keV. It can be concluded from the experimental results that heating effect of ECRH is very obvious,the energy of ECW is mainly deposited in the plasma center during near-axis ECRH (Bt=1.3T) discharges,and the electron velocity distribution changes from Maxwellian to non-Maxwellian normally.
出处 《核聚变与等离子体物理》 CAS CSCD 北大核心 2010年第2期97-102,共6页 Nuclear Fusion and Plasma Physics
基金 国家自然科学基金资助项目(10675124)
关键词 软X射线脉冲高度分析 硅漂移探测器 电子温度分布 电子速率分布 ECRH Pulse height analysis Silicon drift detector Electron temperature profile Electron velocity distribution ECRH
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