根据环境温度测量制冷型红外成像系统内部杂散辐射

Internal Stray Radiation Measurement for Cooled Infrared Imaging Systems Using Ambient Temperature

内部杂散辐射抑制水平是评价红外成像系统的一项重要指标。由于内部杂散辐射与环境温度有关,其测量过程必须在多个环境温度下进行,存在成本高、时间长且实验设备要求高等缺点。针对上述问题,通过建立多积分时间定标模型,研究环境温度对内部杂散辐射的影响,提出一种采用环境温度测量制冷型红外成像系统内部杂散辐射的方法。该方法通过对制冷型红外探测器定标,获取探测器内部因素对系统输出的影响,结合系统在某一环境温度下的定标结果解算系统内部杂散辐射与环境温度的定量关系,进而计算系统在任意环境温度和积分时间下的内部杂散辐射。通过辐射定标实验验证该方法的有效性,实验结果表明该方法可以实现对制冷型红外成像系统内部杂散辐射的高精度测量。

The suppression level of internal stray radiation is a key indicator to evaluate infrared imaging systems.Being related to ambient temperature,the internal stray radiation must be measured at multiple ambient temperatures,and the measurement has such disadvantages as high cost,long duration and high demand for experimental setups.To solve these problems,the effect of ambient temperature on internal stray radiation is studied by building a multiintegral time calibration model,and a method is proposed to measure internal stray radiation of cooled infrared imaging systems using ambient temperature.In this method,the influence of internal factors of the detector on the system output is obtained by calibrating the cooled infrared detector.Combining the calibration results of the infrared imaging system under a certain ambient temperature,the quantitative relation between internal stray radiation and ambient temperature is resolved.Then the internal stray radiation can be calculated at arbitrary integration times and ambient temperatures.The effectiveness of the proposed method is verified by radiometric calibration experiments.Experimental results indicate that,with the proposed method,high-precision measurement of internal stray radiation in cooled infrared imaging systems can be achieved.