摘要
SiC表面重构的发生会引起表面态密度增加,极大地影响SiC功率器件的性能。本文对4H/6H-SiC(0001)-Si端的(3^(1/2)×3^(1/2))R30°和(3×3)重构结构及3C-SiC(0001)-Si端的(3×2)和(2×1)重构结构分别进行了S原子的吸附研究。结果表明:吸附S原子可以打开表面重构键,不同重构结构均有向体结构恢复的趋势。(3^(1/2)×3^(1/2))R30°和(3×3)重构的最佳吸附率分别是1/2ML和1/3ML,S吸附对(3^(1/2)×3^(1/2))R30°重构的作用更大。(3×2)重构表面在1/6ML下的H3位吸附、(2×1)重构表面在1/2ML下的B位吸附时吸附能最低。S钝化后,3C-SiC比4H/6H-SiC体系表面吸附能小,更稳定,重构结构恢复更理想。
SiC surface reconstruction will cause the increase of surface state densities,which can greatly affect the performance of SiC power devices. This paper aims to investigate the(3^(1/2) × 3^(1/2)) R30° and( 3 ×3) reconstructed structures on 4H/6H-SiC( 0001)-Si terminal and the( 3 × 2) and( 2 × 1)reconstructed structures on 3C-SiC( 0001)-Si terminal after S atoms adsorption. The results show that S adsorption can open the reconstruction bonds and that the different reconstructed structures have a tendency to recover to the ideal models. The optimum adsorption rate of(3^(1/2) × 3^(1/2)) R30° is 1/2ML and that of( 3 × 3) is 1/3ML. The adsorbed S atoms have a greater impact on the recovery of the(3^(1/2) × 3^(1/2))R30° reconstructed structure than that of( 3 × 3). Additionally,H3 site is the best initial position and 1/6ML is the optimum adsorption rate for( 3 × 2) 3C-SiC reconstructed structures,while B site is the best initial position and 1/2ML is the optimum adsorption rate for( 2 × 1) 3C-SiC reconstructed structures.The surface adsorption energy of 3C-SiC reconstructed structures is smaller and the surface is more stable than that of 4H/6H-Si C. The recovery of 3C-SiC reconstructed structures is more desirable.
出处
《人工晶体学报》
CSCD
北大核心
2017年第7期1283-1287,共5页
Journal of Synthetic Crystals
基金
国家自然科学基金(51207128
51677149)
特色研究项目(2016TS021)
关键词
SIC
吸附
表面重构
SiC
adsorption
surface reconstruction