基于分区测试的翻转故障注入方法研究

The research of flip-flop fault injection method based on partition test

针对航空器中SRAM型FPGA的单粒子翻转效应故障注入研究越来越重要的趋势,提出基于分区测试的翻转故障注入方法。根据FPGA配置帧的结构特点,对其进行分区测试,分析配置存储器中的敏感位,找到FPGA配置帧中最为敏感的区域。基于动态可重构技术设计了故障注入测试系统,并进行了试验验证。测试结果表明,该方法具有较好的准确率,且能够大大提高翻转故障注入测试的测试效率。

With the increasingly important trend on fault injection of single event upset for SRAM-based FPGAs in aircraft,a method of flip-flop fault injection based on partition test was proposed.According to the structural characteristics of the FPGA con-figuration frame,partition test is done,the sensitive bits of the configuration memory are analyzed,and the most sensitive area of the FPGA configuration frame is found.This paper designs a test system of fault injection based on dynamic reconfiguration,and verifies it by experiments.The test results show that this method has good accuracy and can greatly improve the efficiency of the flip-flop fault injection test.