EDXRF在外科植入物阳极氧化层杂质元素检测中的应用

Application of EDXRF in Detection of Impurity Elements in Anodic Oxide Layer of Surgical Implants

该文使用X射线荧光能谱仪建立了钛及钛合金表面阳极氧化层中Na、Si、P、S等杂质元素定性半定量分析的检测方法。锁定接骨板产品表面层含有P元素,平均值为1.01%。枕骨板产品表面层含有Si元素,平均值为1.39%。该检测方法具有方便快捷、样品无需预处理等优点,是外科植入物表面阳极氧化层杂质元素定性半定量分析较为理想的检验方法。

This paper established a qualitative and semJ-quantitatJve analysis detection method of the micro-arc oxidation titanium and titanium alloy layer of Na, Si, P, S and other impurity elements by X - ray fluorescence. At the same time, from the angle of technological process, we analyzed the impurity element types and sources, and verify the reliability of this method. The locking plates superficial layer contained P element, the average was 1.01%. The occipital plate superficial layer contained Si element, the average was 1.39%. The advantages of this detection method were convenient and fast, and the sample without pretreatment and so forth. So this detection method was the ideal method of qualitative and semi-quantitative analysis to the micro-arc oxidation of surgical implants.