摘要
球窝现象(HoP、HiP)是BGA常见的焊接不良,简要介绍了其切片特征、形成机理、产生原因、常见应用场景、X-Ray的检测与判别和防控方法。
the phenomenon of Head-on-Pillow (HOP) or Head-ln-PUlow (HIP) is the common defect of BGA solder joint. Introduce the section features, formation mechanism, causing reason, common application scenarios, X-Ray inspection and criteria as well as prevention methods of Head-on-Pillow (HOP) or Head-In- Pillow (HIP) defect of BGA solder joint.
出处
《电子工艺技术》
2017年第4期245-248,共4页
Electronics Process Technology