基于Fluent的35 kV干式空心电抗器温度场仿真分析

Simulation Analysis on Temperature Field of 35 kV Dry-type Air-core Reactor Based on Fluent

干式空心电抗器匝间短路是造成其故障的主要原因,而匝间绝缘材料的劣化受温度等因素的影响,因此对干式空心电抗器进行温度场分析有很重要的意义。文中利用Fluent对电抗器正常运行状态以及气道堵塞状态的温度场进行仿真计算,对不同情况下的各包封的温度分布进行分析。结果表明:在正常运行状态下,电抗器内部包封温升明显高于外部包封,同一包封上部温度高于下部,温差大于20 K,热点位于距顶端10%~20%处;气道堵塞情况下,阻塞处相邻包封温升明显升高,高出正常运行状况30~40 K;气道阻塞对非相邻包封温升影响较小,利用红外测温法测量电抗器外包封温度无法反映内部包封的局部过热。不同状态下的温度场仿真计算,对电抗器绝缘劣化研究以及故障分析提供依据。

Inter-turn short current is the main cause of the failures of dry-type air-core reactors.The properties of the interturn insulation material are influence by the temperature.Therefore,the temperature field analysis is of great importance in the study of insulation failure.In this paper,the software Fluent is used to simulate the temperature field of reactors in normal operation condition and airway obstruction condition. The results show that： in normal operation condition, the temperature of inner packages is obviously higher than the outer packages. The tempe- rature is higher on the upper part of each package with a difference of over 20 K,the highest point is 10%~20% to the top;in the airway obstruction condition,and the nearby package temperature rises significantly 30-40 K compared to normal operation condition.Airway obstruction causes less temperature rise to the non-adjacent package. Therefore infrared thermometry cannot reflect the local overheating of the inner package.The temperature simulation of different conditions provides valuable data for the insulation degradation study and failure analysis.