扫描电子显微镜在三元材料中的应用

Application of Scanning Electron Microscope on Ternary Cathode Material

以扫描电子显微镜(SEM)为本次研究的研究工具,以背散射模式为本次研究的拍摄模式,以表面做过包覆处理的三元正极材料为研究对象,以未对表面做过包覆处理的三元正极材料为空白对比对象,对材料表面形貌表征进行研究。研究了不同发射电压及电子束流大小(sport)对表征效果的影响。结果表明,在加偏压(beam deceleration)后,选择发射电压1 k V,sport在2~3范围内的条件下,对三元材料表面表征效果最佳。

Coated ternary cathode material and uncoated ternary cathode material were researched by scanning electron microscope（ SEM） at back scattering shooting mode. The effect of different emission voltages and sport on SEM image was studied. The results showed that under the conditions of adding beam deceleration on sample stage,1 kV emission voltage and 2 - 3 sport compose,the characteristics effect of the ternary cathode material showed the best.