X射线荧光光谱法测定萤石中CaF_2、CaCO_3、S、Fe及SiO_2

Determination of CaF_2,CaCO_3,S,Fe and SiO_2 in Fluorite by XRF

X射线荧光光谱法分析是目前快速分析方法之一,精密度受基体效应、均匀性、元素间干扰等影响。采用粉末压片法制备样品,用X射线荧光光谱法直接测定F、Ca元素,得出CaF_2及CaCO_3含量,并同时分析萤石中S、Fe、SiO_2的含量。精密度实验表明,待测元素的相对标准偏差均低于0.66%(RSD,n=10),能满足萤石中各元素的检测要求。

X-ray fluorescence （XRF） spectrometry is a rapid spectroscopic analysis method, although its precision was influenced by the matrix effect and inhomogeneity of elements in samples. The samples was prepared by the grinding the samples and then pressing the power. Content of F, Ca, S, Fe and SiO2 in fluorites were rapidly determined by XRF. Furthermore, CaF2 and CaCOacontent was also obtained. The results of precision tests indicated that the relative standard deviation （RSD, n = 10） of elements to be tested were lower than 0.66%, which meets the testing requirements for these species in fluorite.