基于正弦余弦算法的NoC测试规划研究

Test scheduling research for network-on-chip based on sine cosine algorithm

如何实现多约束条件下测试时间优化是目前片上网络(NoC)测试中亟待解决的问题。提出一种基于正弦余弦算法(SCA)的NoC测试规划优化方法。采用专用TAM的并行测试方法,在满足功耗、引脚约束的条件下,建立测试规划模型,对NoC进行测试。通过群体围绕最优解进行正弦、余弦的波动,以及多个随机算子和自适应变量进行寻优,达到最小化测试时间的目的。在ITC’02 test benchmarks测试集上进行对比实验,结果表明相比粒子群优化(PSO)算法,提出的算法能够获得更短的测试时间。

How to optimize the test time under multiple constraints is an urgent problem to be solved in the network-on-chip（ NoC）testing.An optimization method of NoC test scheduling based on sine cosine algorithm（ SCA） is proposed.A parallel test method using dedicated test access mechanism（ TAM） is adopted,and a test scheduling model for NoC is built to satisfy the power consumption and pin constraints.To achieve test time minimization,the population fluctuation with the sine and the cosine function around the optimal solution,and a group of random operators and adaptive variables are adopted.Comparing experiments on the ITC＇02 test benchmarks test show that the proposed algorithm can achieve shorter test time than that of the particle swarm optimization（ PSO） algorithm.