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LS-SVM-based surface roughness prediction model for a reflective fiber optic sensor 被引量:1

LS-SVM-based surface roughness prediction model for a reflective fiber optic sensor
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摘要 Reflective fiber optic sensors have advantages for surface roughness measurements of some special workpieces,but their measuring precision and efficiency need to be improved further. A least-squares support vector machine(LS-SVM)-based surface roughness prediction model is proposed to estimate the surface roughness, Ra, and the coupled simulated annealing(CSA) and standard simplex(SS) methods are combined for the parameter optimization of the mode. Experiments are conducted to test the performance of the proposed model, and the results show that the range of average relative errors is-4.232%–2.5709%. In comparison with the existing models, the LS-SVM-based model has the best performance in prediction precision, stability, and timesaving. Reflective fiber optic sensors have advantages for surface roughness measurements of some special workpieces,but their measuring precision and efficiency need to be improved further. A least-squares support vector machine(LS-SVM)-based surface roughness prediction model is proposed to estimate the surface roughness, Ra, and the coupled simulated annealing(CSA) and standard simplex(SS) methods are combined for the parameter optimization of the mode. Experiments are conducted to test the performance of the proposed model, and the results show that the range of average relative errors is-4.232%–2.5709%. In comparison with the existing models, the LS-SVM-based model has the best performance in prediction precision, stability, and timesaving.
作者 付丽 罗钧 陈伟民 刘学明 周东 张中玲 李胜 Li Fu Jun Luo Weimin Chen Xueming Liu Dong Zhou zhongling Zhang Sheng Li(Key Lab of Optoelectronic Technology & Systems of Ministry of Education, Chongqing University, Chongqing 400044, China 5011 District Measurement Station of Weapon Industry, Chongqing 400050, China)
出处 《Chinese Optics Letters》 SCIE EI CAS CSCD 2017年第9期61-65,共5页 中国光学快报(英文版)
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