摘要
通过定性模拟实验,制备交流220 V电路中铜导线一次短路熔痕和二次短路熔痕,应用SEM和EDS等方法研究铜导线一次短路熔痕与二次短路熔痕外表面晶粒的微观形貌特征以及化学元素变化规律。结果表明,短路方式是铜导线短路熔痕晶粒形貌特征的决定因素。铜导线一次短路熔痕晶粒呈现胞状晶形貌特征,二次短路熔痕晶粒呈现柱状晶形貌特征,熔痕凝固及火灾过程中形成的氧化膜不会影响熔痕晶粒形貌特征。
Primary molten marks and secondary molten marks were made under 220 V AC by qualitative experiments. The characteristics of crystal talc-morphology and the element changing rules on primary molten marks and secondary molten marks were analyzed by SEM-EDS. The short circuit mode affects the crystal characteristics of copper melted mark mainly. The primary molten marks show cellular crystal while the second molten marks show columnar crystal. Oxide film doesn＇t have influence on the characteristics of crystal talc-morphology.
作者
杜鑫
陈克
张健
DU Xin CHEN Ke ZHANG Jian(The Chinese People＇ s Armed Police Forces Academy, He bei Langfang 065000, China Lianyuan Fire Detaehment,Jilin Li aoyuan 136200, China Tianjin Fire Research Institute of MPS Tianjin 300381, China)
出处
《消防科学与技术》
CAS
北大核心
2017年第8期1171-1173,1178,共4页
Fire Science and Technology
基金
公安部面上(基科费)项目(2015JSYJC32)
关键词
一次短路
二次短路
熔痕
晶粒
SEM
火灾调查
first short circuit
second short circuit
melted mark
grain crystal
scanning electron microscope
fire investigation
