全反射X射线技术应用于镀锌板锌层测量的模拟研究

The Simulation Research of Total-Reflection X-Ray Fluorescence Analysis Technology Applied in Measurement of Galvanized Sheet Layer

分析了传统的X射线荧光镀锌板锌层测量法,提出了基于全反射X射线荧光分析技术的镀锌板锌层测量方法,并在MCNP中建立X射线全反射模型进行模拟仿真。X射线全反射发生时锌层将原级X射线几乎反射,并在镀锌板法向方向伴随产生少量X射线荧光。针对此特征X射线荧光直接进行分析有效地减少了X射线源的散射本底,提高了测量精度,并且降低了所需源X射线的能量。模拟结果验证了镀锌板上发生X射线全反射的可行性,为实际应用提供了理论依据。

This paper analyzes the traditional X-ray fluorescence method to measure the zinc layer thickness of galvanized sheets layer.It proposes a measuring method of galvanized zinc layer based on total reflection X-ray fluorescence analysis technology,and the X-ray total reflection model is set up for simulation in the MCNP.When the X-ray total reflection occurs,zinc layer will almost make the X-ray source reflect completely,associated with a small amount of X-ray fluorescence producing in the normal direction of the galvanized sheet.Using this X-ray fluorescence to analyze directly can effectively reduce the scattering background of source X-ray,improve the accuracy of measurement and reduce the required source X-ray energy.The Simulation results demonstrate that the feasibility of the X-ray total reflection on galvanized sheet,it provides the theoretical basis for practical application.