摘要
The soft fault induced by parameter variation is one of the most challenging problems in the domain of fault diagnosis for analog circuits.A new fault location and parameter prediction approach for soft-faults diagnosis in analog circuits is presented in this paper.The proposed method extracts the original signals from the output terminals of the circuits under test（CUT） by a data acquisition board.Firstly,the phase deviation value between fault-free and faulty conditions is obtained by fitting the sampling sequence with a sine curve.Secondly,the sampling sequence is organized into a square matrix and the spectral radius of this matrix is obtained.Thirdly,the smallest error of the spectral radius and the corresponding component value are obtained through comparing the spectral radius and phase deviation value with the trend curves of them,respectively,which are calculated from the simulation data.Finally,the fault location is completed by using the smallest error,and the corresponding component value is the parameter identification result.Both simulated and experimental results show the effectiveness of the proposed approach.It is particularly suitable for the fault location and parameter identification for analog integrated circuits.
The soft fault induced by parameter variation is one of the most challenging problems in the domain of fault diagnosis for analog circuits.A new fault location and parameter prediction approach for soft-faults diagnosis in analog circuits is presented in this paper.The proposed method extracts the original signals from the output terminals of the circuits under test（CUT） by a data acquisition board.Firstly,the phase deviation value between fault-free and faulty conditions is obtained by fitting the sampling sequence with a sine curve.Secondly,the sampling sequence is organized into a square matrix and the spectral radius of this matrix is obtained.Thirdly,the smallest error of the spectral radius and the corresponding component value are obtained through comparing the spectral radius and phase deviation value with the trend curves of them,respectively,which are calculated from the simulation data.Finally,the fault location is completed by using the smallest error,and the corresponding component value is the parameter identification result.Both simulated and experimental results show the effectiveness of the proposed approach.It is particularly suitable for the fault location and parameter identification for analog integrated circuits.
基金
supported by the National Natural Science Foundation of China under Grant No.61371049
