硅基光子交换芯片的路由控制与性能测试

Routing control and performance test of silicon-based photonic switching chip

设计了电压输出范围分别是0~10V和0~2V、调节精度为10mV的可扩展热控电路和电控电路,用于实现16×16光子集成芯片的工艺误差补偿和光开关切换。描述了由硅(Si)基马赫-曾德尔(MZI)光开关单元组成的16×16光子集成芯片控制过程,提出了基于光开关传输性能的改进环路路由算法,此算法适用于光开关性能劣化或局部出现故障的情形。搭建了运行有改进路由算法的光交换芯片测试系统,实验结果表明,芯片模块的插入损耗小于33dB,串扰小于-10dB,能够实现无误码传输要求。

The large-scale ex tensible thermo-optic and electro-optic controlling circuits with the output voltage ranges of 0-10V and 0-2V （tuning resoluti on of 10mV） are designed respectively,in order to compensate for the fabrication error and drive the optical switch elements of 16×16integrat ed optical switching chip.We describe the control process of the 16×16integrated optical switching chip,which is composed of Mach-Zehn der interference （MZI） switch elements.A modified looping algorithm to route data based on the optical switching performance is proposed,which can be applied for the cases with deterioration or partial failure of the switch ing elements.We set up the test platform for the silicon-based integrated photonic switching chip with the modified looping algo rithm,and the measured results show that the insertion loss and crosstalk of the chip module are below 33dB and -10dB,respectively, which meet the requirement for error-free transmission in optical communication system.