摘要
ZnO whiskers observation on the surface of SnZn/Cu solder joints in concentrator silicon solar cells solder layer is reported. In the experiment,SnZn/Cu samples are left in laboratory after reflow soldering for two years before an examination by SEM,then ZnO whiskers can be observed obviously,which grows out from the rich-Zn phase of the samples and causes electrical short circuit in the electronics appliances,which demonstrates that the SnZn solder shows a risk for the short circuiting failure of an electronic device. Moreover,the growth mechanism of ZnO whiskers is researched based on cracked oxide theory,which provides the reference support for SnZn solders application.
ZnO whiskers observation on the surface of SnZn/Cu solder joints in concentrator silicon solar cells solder layer is reported. In the experiment,SnZn/Cu samples are left in laboratory after reflow soldering for two years before an examination by SEM,then ZnO whiskers can be observed obviously,which grows out from the rich-Zn phase of the samples and causes electrical short circuit in the electronics appliances,which demonstrates that the SnZn solder shows a risk for the short circuiting failure of an electronic device. Moreover,the growth mechanism of ZnO whiskers is researched based on cracked oxide theory,which provides the reference support for SnZn solders application.
基金
Supported by the National Natural Science Foundation of China(No.51475220)
State Foundation of Laboratory of Advanced Brazing Filler Metals&Technology(Zhengzhou Research Institute of Mechanical Engineering)(No.SKLABFMT-2015-03)
High Level Talent Plan of Jiangsu Normal University(No.YQ2015002)
